Park Systems Announces Revolutionary Single Click Software SmartScan Available on Park XE Series Atomic Force Microscopes

Park XE15 AFM, a powerfully versatile atomic force microscope featuring a unique MultiSample™ scan, with the ability to automatically image and measure up to nine individual samples

With SmartScan mode, the AFM automatically does the frequency sweep and intelligently decides on the best amplitude/frequency setting and the images are as impressive as if they were done by an expert AFM user.

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 just announced that Park SmartScan, a powerful AFM operating software that drastically boosts productivity with single click reliable nanoscale images, is now available on Park XE…

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